Ion Mill and tools for TEM specimen preparation

It is expected to procure a set of tools for the preparation of site specific and transmission electron

microscopy (TEM) specimens from solid materials. This set should include instruments for the

preparation of thin-foil and section specimens from as-cut up to 1 mm thick samples by

ultrasonic cutting/mechanical punching, mechanical parallel-surface and dimple grinding to a size

suitable for Ion Milling and final precision Ion Milling to electron transparency. An example set of

instruments may include (a) ultrasonic cutter, (b) mechanical punch for disks 3 mm in diameter, (c)

specimen holder and other tools for precision parallel-surface grinding, (d) dimple grinder, and (e) ion

mill.