AFM tips for Nano FTIR microscopy

The purchase concerns AFM tips for nano FTIR microscopy (neaSNOM). These tips were specially developed for scattering type scanning near field optical microscopy (sSNOM) by the manufacturer of our instrument because of deficiencies of other tips available on the market. They provide a higher signal to noise ratio (around 5 times) in the infrared spectra recorded with our neaSNOM instrument.

We will buy 380 nano FTIR AFM tips (product number NSP-380) from Neaspec GmbH, which is the only company providing these tips optimized for sSNOM measurements. We are already now working with these tips that have been developed for our type of instrument, and the tips have proven to work well with our setup. These tips enable a better quality of the infrared spectra and images than ordinary AFM tips.